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dc.contributor.authorRodrigues, Pedro Augusto Matos-
dc.contributor.authorAraújo-Silva, Marcos Antônio-
dc.contributor.authorNarvaez, G. A.-
dc.contributor.authorCerdeira, Fernando-
dc.contributor.authorBean, J. C.-
dc.date.accessioned2010-12-15T16:02:51Z-
dc.date.available2010-12-15T16:02:51Z-
dc.date.issued1999-09-
dc.identifier.citationRODRIGUES, P. A. M. et al. Low temperature photoluminescence in ultra-thin germanium quantum wells. Brazilian Journal of Physics, São Paulo, v. 29, n. 3, p. 547-550, set. 1999. Disponível em: <http://www.scielo.br/pdf/bjp/v29n3/v29_547.pdf>. Acesso em: 13 dez. 2010. doi: 10.1590/S0103-97331999000300020.en
dc.identifier.urihttp://repositorio.unb.br/handle/10482/6174-
dc.language.isoInglêsen
dc.rightsAcesso Abertoen
dc.titleLow temperature photoluminescence in ultra-thin germanium quantum wellsen
dc.typeArtigoen
dc.subject.keywordFotoluminescênciaen
dc.subject.keywordFísica quânticaen
dc.identifier.doihttp://dx.doi.org/10.1590/S0103-97331999000300020en
dc.description.abstract1We measured the photoluminescence (PL) spectra of a series of Gen quantum wells as a function of temperature, from 2K to 50K. The PL spectra at 2.1K are dominated by broad emission lines, which can be interpreted as recombination across the indirect gap of the Si/Ge microstructure and are strongly inuenced by the interface morphology of each sample. Beyond T & 15K, all samples show identical spectra in which the broad structures are replaced by thin, strong lines. We interpret these changes as a quenching of the recpmbination across the gap PL of the microstructure and the appearance of defect-related peaks from the Si substrate.-
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